FT-IR

FT-IR Spectroscopy: Your Go to Technique

FT-IR spectroscopy is a go-to technique in various industries for tasks like quality control, failure analysis, and research. It swiftly analyzes almost any sample with minimal preparation. With an FT-IR spectrometer, anyone can operate and obtain top-notch results.

Bruker Alpha II

The Bruker ALPHA II is a compact routine FT-IR spectrometer built for rapid chemical analysis where user convenience and reliability matter more than research-grade flexibility. Fourier Transform Infrared spectroscopy analyses almost any sample in minutes with little to no sample preparation, which is why it has become the standard technique across quality control, failure analysis and R&D. The ALPHA II packs benchtop QC performance into a compact form factor so any operator can obtain high-quality results without specialist training.

Key features:

• Compact benchtop design for routine chemical analysis

• Fast measurements with minimal sample preparation

• Suitable for quality control, failure analysis and research and development

• Simple operation - no specialist FT-IR training required

• Part of Bruker's full routine FT-IR portfolio alongside portable and research platforms

Typical applications:

• Incoming goods and quality control inspection

• Raw material identification

• Routine chemical analysis across industries

• Failure and root-cause analysis

Bruker Invenio

Bruker Optics offers a range of laboratory FT-IR research spectrometers built on a fully upgradeable optics platform, so an instrument purchased for one application can grow into new techniques rather than being replaced. INVENIO sets the standard for next-generation intelligent R&D FT-IR spectrometers, combining innovative technology with smart design for advanced quality control, analytical service and multi-spectral research. Because the platform is modular, it supports specialised extensions such as CryoSAS for semiconductor material quality control, CONFOCHECK for protein stability and conformation studies in water, PMA 50 for polarization-modulated IR spectroscopy including PM-IRRAS and VCD, and TG-FT-IR, which combines thermogravimetric analysis with FT-IR for simultaneous quantitative and qualitative results.

Key features:

• Fully upgradeable optics platform for evolving research needs

• Suited to advanced quality control, analytical service and R&D

• Modular accessories cover semiconductors, protein science, polarization spectroscopy and thermal analysis

• Multi-spectral capability on a single instrument platform

Typical applications:

• Advanced R&D and multi-spectral research

• Protein stability and conformation studies (CONFOCHECK)

• Semiconductor material quality control (CryoSAS)

• Simultaneous thermal and chemical analysis (TG-FT-IR)

Bruker Vertex

Bruker Optics offers a range of laboratory FT-IR research spectrometers built on a fully upgradeable optics platform, so an instrument purchased for one application can grow into new techniques rather than being replaced. INVENIO sets the standard for next-generation intelligent R&D FT-IR spectrometers, combining innovative technology with smart design for advanced quality control, analytical service and multi-spectral research. Because the platform is modular, it supports specialised extensions such as CryoSAS for semiconductor material quality control, CONFOCHECK for protein stability and conformation studies in water, PMA 50 for polarization-modulated IR spectroscopy including PM-IRRAS and VCD, and TG-FT-IR, which combines thermogravimetric analysis with FT-IR for simultaneous quantitative and qualitative results.

Key features:

• Fully upgradeable optics platform for evolving research needs

• Suited to advanced quality control, analytical service and R&D

• Modular accessories cover semiconductors, protein science, polarization spectroscopy and thermal analysis

• Multi-spectral capability on a single instrument platform

Typical applications:

• Advanced R&D and multi-spectral research

• Protein stability and conformation studies (CONFOCHECK)

• Semiconductor material quality control (CryoSAS)

• Simultaneous thermal and chemical analysis (TG-FT-IR)

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