Electron Microscopes
If you are looking for the highest magnification power and quality elemental composition data, you are in the right place. We proudly offer advanced electron microscopy solutions powered by our trusted partner, JEOL.
Jeol’s state-of-the-art equipment ensures that you receive unparalleled imaging resolution and precise analytical capabilities, allowing you to explore materials at the nanoscale with confidence. Here is what we are offering today: Link
Transmission Electron Microscope (TEM): High resolution observation and structural analysis of the atomic level, elemental analysis of micro to nano area are possible
Full range of TEM equipment: Link
Scanning Electron Microscope (SEM): Mainly, observation of surface structure and elemental analysis can be performed.
JEOL scanning electron microscopes (SEM), along with their abundant range of attachments for surface observation and analysis, are among the most actively used instruments at R&D institutes and quality-test sites worldwide. JEOL offers a wide lineup, from general-purpose SEMs (W-SEM) — including benchtop models such as the JCM-7000 NeoScope and JCM-7000Plus NeoScope, which allow operation by anyone without specialist knowledge or technique — through to high-end field-emission SEMs (FE-SEM) such as the JSM-IT810 Schottky FE-SEM, JSM-IT710HR, JSM-IT210 and JSM-IT510 InTouchScope. Energy-dispersive X-ray spectrometers (EDS) for elemental analysis are also developed in-house, giving a complete surface-imaging and chemical-analysis solution from one manufacturer.
Key features:
• Benchtop general-purpose SEMs (JCM-7000 NeoScope series) usable without specialist training
• High-end field-emission SEMs (FE-SEM), including the JSM-IT810 Schottky model
• JSM-IT710HR, JSM-IT210 and JSM-IT510 InTouchScope models covering multiple performance tiers
• In-house energy-dispersive X-ray spectrometers (EDS) for elemental analysis
• Wide range of attachments for surface observation and analysis
Typical applications:
• Surface observation and morphological analysis in R&D
• Quality-control and failure-analysis testing sites
• Elemental analysis combined with SEM imaging via EDS
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