JEOL Electron microscopy

JEOL scanning electron microscopes (SEM), along with their abundant range of attachments for surface observation and analysis, are among the most actively used instruments at R&D institutes and quality-test sites worldwide. JEOL offers a wide lineup, from general-purpose SEMs (W-SEM) — including benchtop models such as the JCM-7000 NeoScope and JCM-7000Plus NeoScope, which allow operation by anyone without specialist knowledge or technique — through to high-end field-emission SEMs (FE-SEM) such as the JSM-IT810 Schottky FE-SEM, JSM-IT710HR, JSM-IT210 and JSM-IT510 InTouchScope. Energy-dispersive X-ray spectrometers (EDS) for elemental analysis are also developed in-house, giving a complete surface-imaging and chemical-analysis solution from one manufacturer.

Key features:

• Benchtop general-purpose SEMs (JCM-7000 NeoScope series) usable without specialist training

• High-end field-emission SEMs (FE-SEM), including the JSM-IT810 Schottky model

• JSM-IT710HR, JSM-IT210 and JSM-IT510 InTouchScope models covering multiple performance tiers

• In-house energy-dispersive X-ray spectrometers (EDS) for elemental analysis

• Wide range of attachments for surface observation and analysis

Typical applications:

• Surface observation and morphological analysis in R&D

• Quality-control and failure-analysis testing sites

• Elemental analysis combined with SEM imaging via EDS